Qualcomm: >> Snapdragon 8 Gen 2 Firmware Security Vulnerabilities
Memory corruption while calling the NPU driver APIs concurrently.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Transient DOS may occur while processing the country IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-03-03
Memory corruption may occur while validating ports and channels in Audio driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption in display driver while detaching a device.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Information disclosure while deriving keys for a session for any Widevine use case.
CVSS Score
5.5
EPSS Score
0.0
Published
2025-03-03
Transient DOS during hypervisor virtual I/O operation in a virtual machine.
CVSS Score
5.5
EPSS Score
0.0
Published
2025-03-03
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-09-02
Transient DOS while processing TIM IE from beacon frame as there is no check for IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2024-09-02
Memory corruption while passing untrusted/corrupted pointers from DSP to EVA.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Memory corruption when Alternative Frequency offset value is set to 255.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
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