Qualcomm: >> Snapdragon 821 Mobile Security Vulnerabilities
Transient DOS may occur while processing malformed length field in SSID IEs.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-07-08
Transient DOS while processing received beacon frame.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-07-08
Memory corruption when there is failed unmap operation in GPU.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-04-01
Memory corruption in SPS Application while requesting for public key in sorter TA.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-04-01
Memory corruption while processing finish_sign command to pass a rsp buffer.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-04-01