Qualcomm: >> Snapdragon 820 Automotive Security Vulnerabilities
Transient DOS may occur while processing malformed length field in SSID IEs.
CVSS Score
7.5
EPSS Score
0.0
Published
2025-07-08
Transient DOS while processing received beacon frame.
CVSS Score
7.5
EPSS Score
0.0
Published
2025-07-08
Information disclosure while decoding this RTP packet Payload when UE receives the RTP packet from the network.
CVSS Score
8.2
EPSS Score
0.0
Published
2025-07-08
Memory corruption during concurrent access to server info object due to unprotected critical field.
CVSS Score
6.6
EPSS Score
0.0
Published
2025-05-06
Transient DOS may occur while processing the country IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-03-03
Memory corruption while processing input message passed from FE driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Information disclosure during audio playback.
CVSS Score
6.1
EPSS Score
0.0
Published
2025-02-03
Memory corruption can occur if an already verified IFS2 image is overwritten, bypassing boot verification. This allows unauthorized programs to be injected into security-sensitive images, enabling the booting of a tampered IFS2 system image.
CVSS Score
8.4
EPSS Score
0.0
Published
2025-01-06
Information disclosure while invoking callback function of sound model driver from ADSP for every valid opcode received from sound model driver.
CVSS Score
6.1
EPSS Score
0.0
Published
2025-01-06
Memory corruption when user provides data for FM HCI command control operations.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
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