Qualcomm: >> Snapdragon 8+ Gen 2 Mobile Firmware Security Vulnerabilities
Memory corruption may occur while accessing a variable during extended back to back tests.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption can occur in the camera when an invalid CID is used.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while power-up or power-down sequence of the camera sensor.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Information disclosure while parsing the OCI IE with invalid length.
CVSS Score
8.2
EPSS Score
0.0
Published
2025-02-03
Memory corruption during management frame processing due to mismatch in T2LM info element.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03
Memory corruption while parsing the ML IE due to invalid frame content.
CVSS Score
9.8
EPSS Score
0.001
Published
2025-02-03
Memory corruption while validating number of devices in Camera kernel .
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while registering a buffer from user-space to kernel-space using IOCTL calls.
CVSS Score
6.6
EPSS Score
0.0
Published
2025-02-03
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
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