Qualcomm: >> Snapdragon 670 Mobile Security Vulnerabilities
Transient DOS may occur while processing malformed length field in SSID IEs.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-07-08
Transient DOS while processing received beacon frame.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-07-08
Cryptographic issue while processing crypto API calls, missing checks may lead to corrupted key usage or IV reuses.
CVSS Score
7.1
EPSS Score
0.0
Published
2025-07-08
Information disclosure while decoding this RTP packet Payload when UE receives the RTP packet from the network.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-07-08
Memory corruption while retrieving the CBOR data from TA.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-07-08
Transient DOS when importing a PKCS#8-encoded RSA private key with a zero-sized modulus.
CVSS Score
6.2
EPSS Score
0.0
Published
2025-07-08
Memory corruption while operating the mailbox in Automotive.
CVSS Score
5.3
EPSS Score
0.0
Published
2025-07-08
Memory corruption while triggering commands in the PlayReady Trusted application.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption while processing a data structure, when an iterator is accessed after it has been removed, potential failures occur.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption while reading secure file.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
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