Qualcomm: >> Qcc2073 Firmware Security Vulnerabilities
Transient DOS while parsing per STA profile in ML IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-05-06
Transient DOS may occur while processing the country IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-03-03
Information disclosure while parsing the OCI IE with invalid length.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03
Memory corruption during management frame processing due to mismatch in T2LM info element.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03
Memory corruption while Invoking IOCTL calls from user-space to validate FIPS encryption or decryption functionality.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while handling IOCTL call from user-space to set latency level.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-01-06
Memory corruption when IOCTL call is invoked from user-space to read board data.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
Memory corruption while processing FIPS encryption or decryption IOCTL call invoked from user-space.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
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