Qualcomm: >> Snapdragon Ar2 Gen 1 Platform Firmware Security Vulnerabilities
Transient DOS in Bluetooth Host while rfc slot allocation.
CVSS Score
7.5
EPSS Score
0.006
Published
2023-12-05
Memory corruption in Boot while running a ListVars test in UEFI Menu during boot.
CVSS Score
7.8
EPSS Score
0.001
Published
2023-12-05
Memory corruption in HLOS while invoking IOCTL calls from user-space.
CVSS Score
8.4
EPSS Score
0.001
Published
2023-12-05
Memory corruption while loading an ELF segment in TEE Kernel.
CVSS Score
8.2
EPSS Score
0.0
Published
2023-12-05
Information disclosure when the trusted application metadata symbol addresses are accessed while loading an ELF in TEE.
CVSS Score
6.0
EPSS Score
0.0
Published
2023-12-05
Memory corruption in BT controller while parsing debug commands with specific sub-opcodes at HCI interface level.
CVSS Score
7.8
EPSS Score
0.001
Published
2023-12-05
Memory Corruption in SPS Application while exporting public key in sorter TA.
CVSS Score
7.8
EPSS Score
0.001
Published
2023-12-05
Transient DOS in WLAN Firmware while parsing t2lm buffers.
CVSS Score
7.5
EPSS Score
0.003
Published
2023-11-07
Transient DOS in WLAN Firmware when firmware receives beacon including T2LM IE.
CVSS Score
7.5
EPSS Score
0.002
Published
2023-11-07
Transient DOS in WLAN Firmware while parsing WLAN beacon or probe-response frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2023-11-07