Qualcomm: >> Snapdragon 855 Mobile Platform Security Vulnerabilities
Memory corruption while processing pin reply in Bluetooth, when pin code received from APP layer is greater than expected size.
CVSS Score
8.4
EPSS Score
0.001
Published
2023-12-05
CVE-2023-33107
Memory corruption in Graphics Linux while assigning shared virtual memory region during IOCTL call.
Known exploited
CVSS Score
8.4
EPSS Score
0.001
Published
2023-12-05
Memory corruption when processing cmd parameters while parsing vdev.
CVSS Score
8.4
EPSS Score
0.001
Published
2023-12-05
Transient DOS in Bluetooth Host while rfc slot allocation.
CVSS Score
7.5
EPSS Score
0.006
Published
2023-12-05
Memory corruption in UTILS when modem processes memory specific Diag commands having arbitrary address values as input arguments.
CVSS Score
7.8
EPSS Score
0.001
Published
2023-12-05
Memory corruption while loading an ELF segment in TEE Kernel.
CVSS Score
8.2
EPSS Score
0.0
Published
2023-12-05
Information disclosure when the trusted application metadata symbol addresses are accessed while loading an ELF in TEE.
CVSS Score
6.0
EPSS Score
0.0
Published
2023-12-05
Memory corruption in BT controller while parsing debug commands with specific sub-opcodes at HCI interface level.
CVSS Score
7.8
EPSS Score
0.001
Published
2023-12-05
Memory Corruption in Radio Interface Layer while sending an SMS or writing an SMS to SIM.
CVSS Score
6.7
EPSS Score
0.0
Published
2023-12-05
Memory Corruption in camera while installing a fd for a particular DMA buffer.
CVSS Score
6.7
EPSS Score
0.0
Published
2023-12-05