Qualcomm: >> Wcd9341 Security Vulnerabilities
Memory corruption may occur during IO configuration processing when the IO port count is invalid.
CVSS Score
6.6
EPSS Score
0.0
Published
2025-05-06
Memory corruption during concurrent access to server info object due to unprotected critical field.
CVSS Score
6.6
EPSS Score
0.0
Published
2025-05-06
Memory corruption during concurrent access to server info object due to incorrect reference count update.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Transient DOS may occur while parsing SSID in action frames.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
Memory corruption occurs while connecting a STA to an AP and initiating an ADD TS request.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Memory corruption while processing multiple IOCTL calls from HLOS to DSP.
CVSS Score
6.7
EPSS Score
0.0
Published
2025-04-07