Qualcomm: >> Wcn3988 Security Vulnerabilities
Memory corruption during the FRS UDS generation process.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption while processing a data structure, when an iterator is accessed after it has been removed, potential failures occur.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption while reading secure file.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption may occur during IO configuration processing when the IO port count is invalid.
CVSS Score
6.6
EPSS Score
0.0
Published
2025-05-06
Memory corruption while prociesing command buffer buffer in OPE module.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption during concurrent access to server info object due to unprotected critical field.
CVSS Score
6.6
EPSS Score
0.0
Published
2025-05-06
Memory corruption during concurrent access to server info object due to incorrect reference count update.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption during concurrent SSR execution due to race condition on the global maps list.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption can occur when TME processes addresses from TZ and MPSS requests without proper validation.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
Memory corruption occurs during the copying of read data from the EEPROM because the IO configuration is exposed as shared memory.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07