Qualcomm: >> Wcd9341 Firmware Security Vulnerabilities
Memory corruption while parsing the memory map info in IOCTL calls.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-01-06
Memory corruption when IOCTL call is invoked from user-space to read board data.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
Information disclosure while invoking callback function of sound model driver from ADSP for every valid opcode received from sound model driver.
CVSS Score
6.1
EPSS Score
0.0
Published
2025-01-06
Memory corruption while invoking IOCTL calls from user space to issue factory test command inside WLAN driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-12-02
Memory corruption while Configuring the SMR/S2CR register in Bypass mode.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-12-02
Memory corruption when multiple threads try to unregister the CVP buffer at the same time.
CVSS Score
6.7
EPSS Score
0.0
Published
2024-12-02
Memory corruption when allocating and accessing an entry in an SMEM partition continuously.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-12-02
Transient DOS while parsing the ML IE when a beacon with common info length of the ML IE greater than the ML IE inside which this element is present.
CVSS Score
7.5
EPSS Score
0.001
Published
2024-12-02