Qualcomm: >> Sw5100 Firmware Security Vulnerabilities
Memory corruption during concurrent SSR execution due to race condition on the global maps list.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption may occur while initiating two IOCTL calls simultaneously to create processes from two different threads.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
Memory corruption occurs during the copying of read data from the EEPROM because the IO configuration is exposed as shared memory.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
Memory corruption while calling the NPU driver APIs concurrently.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Transient DOS may occur while processing the country IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-03-03
Memory corruption may occur while validating ports and channels in Audio driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption may occur while accessing a variable during extended back to back tests.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption in display driver while detaching a device.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
While processing the authentication message in UE, improper authentication may lead to information disclosure.
CVSS Score
5.4
EPSS Score
0.0
Published
2025-03-03
Information disclosure while deriving keys for a session for any Widevine use case.
CVSS Score
5.5
EPSS Score
0.0
Published
2025-03-03