Qualcomm: >> Snapdragon W5+ Gen 1 Wearable Security Vulnerabilities
Memory corruption while processing IOCTL from user space to handle GPU AHB bus error.
CVSS Score
7.8
EPSS Score
0.001
Published
2025-02-03
Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace.
CVSS Score
7.8
EPSS Score
0.001
Published
2025-02-03
Information disclosure while processing information on firmware image during core initialization.
CVSS Score
6.1
EPSS Score
0.001
Published
2025-02-03
Memory corruption while parsing the memory map info in IOCTL calls.
CVSS Score
7.8
EPSS Score
0.001
Published
2025-02-03
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
CVSS Score
7.8
EPSS Score
0.001
Published
2025-01-06
Memory corruption while processing IOCTL call for getting group info.
CVSS Score
7.8
EPSS Score
0.007
Published
2024-09-02
Memory corruption when two threads try to map and unmap a single node simultaneously.
CVSS Score
8.4
EPSS Score
0.002
Published
2024-09-02
Memory corruption while processing concurrent IOCTL calls.
CVSS Score
7.8
EPSS Score
0.001
Published
2024-09-02
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
CVSS Score
7.5
EPSS Score
0.003
Published
2024-09-02
Transient DOS while processing TIM IE from beacon frame as there is no check for IE length.
CVSS Score
7.5
EPSS Score
0.003
Published
2024-09-02