Qualcomm: >> Wcn3660b Firmware Security Vulnerabilities
Memory corruption when blob structure is modified by user-space after kernel verification.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption during concurrent buffer access due to modification of the reference count.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption during concurrent SSR execution due to race condition on the global maps list.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption while calling the NPU driver APIs concurrently.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Transient DOS may occur while processing the country IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-03-03
Memory corruption may occur while validating ports and channels in Audio driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption may occur while accessing a variable during extended back to back tests.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption in display driver while detaching a device.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption while invoking IOCTL calls from the use-space for HGSL memory node.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption during voice activation, when sound model parameters are loaded from HLOS to ADSP.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03