Qualcomm: >> Snapdragon 8 Gen 1 Mobile Platform Firmware Security Vulnerabilities
Memory corruption can occur when TME processes addresses from TZ and MPSS requests without proper validation.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
Memory corruption while processing multiple IOCTL calls from HLOS to DSP.
CVSS Score
6.7
EPSS Score
0.0
Published
2025-04-07
Information disclosure while creating MQ channels.
CVSS Score
7.7
EPSS Score
0.0
Published
2025-04-07
Cryptographic issue occurs during PIN/password verification using Gatekeeper, where RPMB writes can be dropped on verification failure, potentially leading to a user throttling bypass.
CVSS Score
6.2
EPSS Score
0.0
Published
2025-04-07
Memory corruption while processing IOCTL calls.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
Cryptographic issues while generating an asymmetric key pair for RKP use cases.
CVSS Score
7.1
EPSS Score
0.0
Published
2025-04-07
Memory corruption occurs during the copying of read data from the EEPROM because the IO configuration is exposed as shared memory.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
Memory corruption while invoking IOCTL map buffer request from userspace.
CVSS Score
6.6
EPSS Score
0.0
Published
2025-04-07
Memory corruption while assigning memory from the source DDR memory(HLOS) to ADSP.
CVSS Score
7.5
EPSS Score
0.0
Published
2025-04-07
There may be information disclosure during memory re-allocation in TZ Secure OS.
CVSS Score
5.5
EPSS Score
0.0
Published
2025-04-07