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Qualcomm:
>> Snapdragon 429 Mobile Firmware
Security Vulnerabilities
CVE-2024-45564
Memory corruption during concurrent access to server info object due to incorrect reference count update.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
CVE-2024-45565
Memory corruption when blob structure is modified by user-space after kernel verification.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
CVE-2024-45566
Memory corruption during concurrent buffer access due to modification of the reference count.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
CVE-2024-45554
Memory corruption during concurrent SSR execution due to race condition on the global maps list.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
CVE-2024-53023
Memory corruption may occur while accessing a variable during extended back to back tests.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
CVE-2024-49834
Memory corruption while power-up or power-down sequence of the camera sensor.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
CVE-2024-45573
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
CVE-2024-49832
Memory corruption in Camera due to unusually high number of nodes passed to AXI port.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
CVE-2024-45560
Memory corruption while taking a snapshot with hardware encoder due to unvalidated userspace buffer.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
CVE-2024-45561
Memory corruption while handling IOCTL call from user-space to set latency level.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
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