Qualcomm: >> Snapdragon 429 Mobile Security Vulnerabilities
Memory corruption during concurrent buffer access due to modification of the reference count.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption during concurrent SSR execution due to race condition on the global maps list.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption may occur while accessing a variable during extended back to back tests.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption while power-up or power-down sequence of the camera sensor.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption in Camera due to unusually high number of nodes passed to AXI port.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while taking a snapshot with hardware encoder due to unvalidated userspace buffer.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while handling IOCTL call from user-space to set latency level.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Information disclosure while processing IO control commands.
CVSS Score
6.1
EPSS Score
0.0
Published
2025-02-03
Memory corruption while parsing the memory map info in IOCTL calls.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03