Qualcomm: >> Qcn9274 Firmware Security Vulnerabilities
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-01-06
Memory corruption while processing API calls to NPU with invalid input.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-12-02
Memory corruption while Configuring the SMR/S2CR register in Bypass mode.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-12-02
Memory corruption when allocating and accessing an entry in an SMEM partition continuously.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-12-02
Transient DOS while parsing the ML IE when a beacon with common info length of the ML IE greater than the ML IE inside which this element is present.
CVSS Score
7.5
EPSS Score
0.001
Published
2024-12-02
Memory corruption while handling session errors from firmware.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-11-04
Cryptographic issue when a controller receives an LMP start encryption command under unexpected conditions.
CVSS Score
8.2
EPSS Score
0.0
Published
2024-11-04
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
CVSS Score
7.5
EPSS Score
0.001
Published
2024-11-04
Transient DOS while processing the CU information from RNR IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2024-11-04
Transient DOS while parsing probe response and assoc response frame.
CVSS Score
7.5
EPSS Score
0.001
Published
2024-10-07