Qualcomm: >> Snapdragon W5+ Gen 1 Wearable Security Vulnerabilities
Memory corruption may occur while validating ports and channels in Audio driver.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption may occur while accessing a variable during extended back to back tests.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption in display driver while detaching a device.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption while processing command in Glink linux.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption while power-up or power-down sequence of the camera sensor.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Information disclosure while parsing the OCI IE with invalid length.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03
Memory corruption while processing IOCTL from user space to handle GPU AHB bus error.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Information disclosure while processing information on firmware image during core initialization.
CVSS Score
6.1
EPSS Score
0.0
Published
2025-02-03
Memory corruption while parsing the memory map info in IOCTL calls.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03