Qualcomm: >> Snapdragon Ar2 Gen 1 Platform Firmware Security Vulnerabilities
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-11-04
Transient DOS while parsing BTM ML IE when per STA profile is not included.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-11-04
Transient DOS while processing the CU information from RNR IE.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-11-04
Memory corruption while invoking IOCTL command from user-space, when a user modifies the original packet size of the command after system properties have been already sent to the EVA driver.
CVSS Score
6.7
EPSS Score
0.0
Published
2024-11-04
Transient DOS while parsing probe response and assoc response frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-10-07
Information disclosure while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
CVSS Score
8.2
EPSS Score
0.002
Published
2024-10-07
Memory corruption can occur if VBOs hold outdated or invalid GPU SMMU mappings, especially when the binding and reclaiming of memory buffers are performed at the same time.
CVSS Score
8.4
EPSS Score
0.001
Published
2024-08-05
Transient DOS while parsing the ML IE when a beacon with length field inside the common info of ML IE greater than the ML IE length.
CVSS Score
7.5
EPSS Score
0.003
Published
2024-08-05
Transient DOS while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
CVSS Score
7.5
EPSS Score
0.003
Published
2024-08-05
Transient DOS while parsing probe response and assoc response frame when received frame length is less than max size of timestamp.
CVSS Score
7.5
EPSS Score
0.003
Published
2024-08-05