Qualcomm: >> Snapdragon Ar2 Gen 1 Firmware Security Vulnerabilities
Memory corruption while power-up or power-down sequence of the camera sensor.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Information disclosure while parsing the OCI IE with invalid length.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03
Memory corruption during management frame processing due to mismatch in T2LM info element.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03
Memory corruption while configuring a Hypervisor based input virtual device.
CVSS Score
8.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
Memory corruption while invoking IOCTL calls to unmap the DMA buffers.
CVSS Score
6.7
EPSS Score
0.0
Published
2025-01-06
Memory corruption while processing IOCTL call for getting group info.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-09-02
Memory corruption when two threads try to map and unmap a single node simultaneously.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-09-02
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-09-02