Qualcomm: >> Snapdragon Ar2 Gen 1 Firmware Security Vulnerabilities
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
Memory corruption while invoking IOCTL calls to unmap the DMA buffers.
CVSS Score
6.7
EPSS Score
0.0
Published
2025-01-06
Memory corruption while processing IOCTL call for getting group info.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-09-02
Memory corruption when two threads try to map and unmap a single node simultaneously.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-09-02
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-09-02
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-09-02
Transient DOS while processing TIM IE from beacon frame as there is no check for IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2024-09-02
Memory corruption while passing untrusted/corrupted pointers from DSP to EVA.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Memory corruption when BTFM client sends new messages over Slimbus to ADSP.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-09-02