Qualcomm: >> Snapdragon 8 Gen 2 Mobile Security Vulnerabilities
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-01-06
Memory corruption when input parameter validation for number of fences is missing for fence frame IOCTL calls,
CVSS Score
6.7
EPSS Score
0.0
Published
2025-01-06
Memory corruption while invoking IOCTL calls to unmap the DMA buffers.
CVSS Score
6.7
EPSS Score
0.0
Published
2025-01-06
Memory corruption while processing frame command IOCTL calls.
CVSS Score
6.7
EPSS Score
0.0
Published
2025-01-06
Memory corruption while processing IOCTL call for getting group info.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Memory corruption when user provides data for FM HCI command control operations.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Memory corruption during the handshake between the Primary Virtual Machine and Trusted Virtual Machine.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-09-02
Memory corruption when two threads try to map and unmap a single node simultaneously.
CVSS Score
8.4
EPSS Score
0.0
Published
2024-09-02
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-09-02