Qualcomm: >> Snapdragon 8+ Gen 2 Mobile Security Vulnerabilities
Memory corruption while retrieving the CBOR data from TA.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-07-08
Transient DOS when importing a PKCS#8-encoded RSA private key with a zero-sized modulus.
CVSS Score
6.2
EPSS Score
0.0
Published
2025-07-08
Memory corruption while operating the mailbox in Automotive.
CVSS Score
5.3
EPSS Score
0.0
Published
2025-07-08
Memory corruption while reading response from FW, when buffer size is changed by FW while driver is using this size to write null character at the end of buffer.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Transient DOS while parsing per STA profile in ML IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-05-06
Memory corruption while processing a data structure, when an iterator is accessed after it has been removed, potential failures occur.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption may occur while accessing a variable during extended back to back tests.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-03-03
Memory corruption can occur in the camera when an invalid CID is used.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while power-up or power-down sequence of the camera sensor.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Information disclosure while parsing the OCI IE with invalid length.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03