Qualcomm: >> Snapdragon 8+ Gen 2 Mobile Security Vulnerabilities
Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while registering a buffer from user-space to kernel-space using IOCTL calls.
CVSS Score
6.6
EPSS Score
0.0
Published
2025-02-03
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-01-06
Memory corruption when input parameter validation for number of fences is missing for fence frame IOCTL calls,
CVSS Score
6.7
EPSS Score
0.0
Published
2025-01-06
Memory corruption while invoking IOCTL calls to unmap the DMA buffers.
CVSS Score
6.7
EPSS Score
0.0
Published
2025-01-06
Memory corruption while processing frame command IOCTL calls.
CVSS Score
6.7
EPSS Score
0.0
Published
2025-01-06
Memory corruption while processing IOCTL call for getting group info.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Memory corruption when user provides data for FM HCI command control operations.
CVSS Score
7.8
EPSS Score
0.0
Published
2024-09-02
Memory corruption during the handshake between the Primary Virtual Machine and Trusted Virtual Machine.
CVSS Score
7.8
EPSS Score
0.001
Published
2024-09-02