Qualcomm: >> Snapdragon 7c+ Gen 3 Compute Security Vulnerabilities
Transient DOS may occur when processing vendor-specific information elements while parsing a WLAN frame for BTM requests.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-07-08
Transient DOS may occur while processing malformed length field in SSID IEs.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-07-08
Information disclosure while decoding this RTP packet Payload when UE receives the RTP packet from the network.
CVSS Score
8.2
EPSS Score
0.0
Published
2025-07-08
Memory corruption while retrieving the CBOR data from TA.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-07-08
Transient DOS when importing a PKCS#8-encoded RSA private key with a zero-sized modulus.
CVSS Score
6.2
EPSS Score
0.0
Published
2025-07-08
CVE-2025-21479
Memory corruption due to unauthorized command execution in GPU micronode while executing specific sequence of commands.
Known exploited
CVSS Score
8.6
EPSS Score
0.002
Published
2025-06-03
CVE-2025-21480
Memory corruption due to unauthorized command execution in GPU micronode while executing specific sequence of commands.
Known exploited
CVSS Score
8.6
EPSS Score
0.016
Published
2025-06-03
memory corruption while processing IOCTL commands, when the buffer in write loopback mode is accessed after being freed.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-06-03
Memory corruption while reading response from FW, when buffer size is changed by FW while driver is using this size to write null character at the end of buffer.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06
Memory corruption while processing image encoding, when input buffer length is 0 in IOCTL call.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-05-06