Qualcomm: >> Qcn6412 Security Vulnerabilities
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-01-06
Transient DOS while parsing the ML IE when a beacon with common info length of the ML IE greater than the ML IE inside which this element is present.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-12-02
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-11-04
Transient DOS while parsing probe response and assoc response frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-10-07
Information disclosure while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
CVSS Score
8.2
EPSS Score
0.002
Published
2024-10-07
Transient DOS while parsing noninheritance IE of Extension element when length of IE is 2 of beacon frame.
CVSS Score
7.5
EPSS Score
0.002
Published
2024-10-07
Memory corruption while redirecting log file to any file location with any file name.
CVSS Score
9.8
EPSS Score
0.002
Published
2024-10-07
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
CVSS Score
7.5
EPSS Score
0.003
Published
2024-09-02
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
CVSS Score
7.5
EPSS Score
0.003
Published
2024-09-02
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
CVSS Score
7.5
EPSS Score
0.003
Published
2024-09-02