Qualcomm: >> Qcc2076 Security Vulnerabilities
Memory corruption occurs while connecting a STA to an AP and initiating an ADD TS request.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Transient DOS may occur while parsing extended IE in beacon.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Transient DOS may occur while processing the country IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-03-03
Information disclosure while parsing the OCI IE with invalid length.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03
Memory corruption during management frame processing due to mismatch in T2LM info element.
CVSS Score
8.2
EPSS Score
0.002
Published
2025-02-03
Memory corruption while Invoking IOCTL calls from user-space to validate FIPS encryption or decryption functionality.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while handling IOCTL call from user-space to set latency level.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
CVSS Score
7.5
EPSS Score
0.002
Published
2025-01-06