Qualcomm: >> Fastconnect 6700 Firmware Security Vulnerabilities
Memory corruption during management frame processing due to mismatch in T2LM info element.
CVSS Score
8.2
EPSS Score
0.001
Published
2025-02-03
Memory corruption while parsing the ML IE due to invalid frame content.
CVSS Score
9.8
EPSS Score
0.001
Published
2025-02-03
Memory corruption may occour occur when stopping the WLAN interface after processing a WMI command from the interface.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while configuring a Hypervisor based input virtual device.
CVSS Score
8.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while taking a snapshot with hardware encoder due to unvalidated userspace buffer.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption while handling IOCTL call from user-space to set latency level.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-02-03
Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-01-06
Memory corruption when IOCTL call is invoked from user-space to read board data.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-01-06