Qualcomm: >> Snapdragon Ar2 Gen 1 Platform Security Vulnerabilities
Transient DOS when a remote device sends an invalid connection request during BT connectable LE scan.
CVSS Score
6.5
EPSS Score
0.0
Published
2025-11-04
Memory corruption while performing encryption and decryption commands.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-11-04
Memory corruption while processing a malformed license file during reboot.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-10-09
Memory corruption during PlayReady APP usecase while processing TA commands.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-10-09
Transient DOS while creating NDP instance.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-08-06
Transient DOS while processing a frame with malformed shared-key descriptor.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-08-06
Transient DOS may occur while parsing SSID in action frames.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Transient DOS may occur while parsing EHT operation IE or EHT capability IE.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-04-07
Memory corruption can occur when TME processes addresses from TZ and MPSS requests without proper validation.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
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