Qualcomm: >> Snapdragon 8 Gen 3 Mobile Platform Firmware Security Vulnerabilities
Transient DOS while creating NDP instance.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-08-06
Transient DOS while processing CCCH data when NW sends data with invalid length.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-08-06
Transient DOS while processing a frame with malformed shared-key descriptor.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-08-06
Memory corruption when programming registers through virtual CDM.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-08-06
CVE-2025-21479
Memory corruption due to unauthorized command execution in GPU micronode while executing specific sequence of commands.
Known exploited
CVSS Score
8.6
EPSS Score
0.002
Published
2025-06-03
CVE-2025-21480
Memory corruption due to unauthorized command execution in GPU micronode while executing specific sequence of commands.
Known exploited
CVSS Score
8.6
EPSS Score
0.016
Published
2025-06-03
Memory corruption while processing INIT and multimode invoke IOCTL calls on FastRPC.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-06-03
Transient DOS while processing the tone measurement response buffer when the response buffer is out of range.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-06-03
Information disclosure may occur while decoding the RTP packet with improper header length for number of contributing sources.
CVSS Score
8.2
EPSS Score
0.0
Published
2025-06-03
Memory corruption may occur while initiating two IOCTL calls simultaneously to create processes from two different threads.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-04-07
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