Vulnerability Details CVE-2022-35858
The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Exploit prediction scoring system (EPSS) score
EPSS Score 0.0
EPSS Ranking 10.5%
CVSS Severity
CVSS v3 Score 7.8
References
- https://github.com/Samsung/mTower/blob/18f4b592a8a973ce5972f4e2658ea0f6e3686284/tee/lib/libutee/tee_api_objects.c#L283
- https://github.com/Samsung/mTower/issues/71
- https://github.com/Samsung/mTower/blob/18f4b592a8a973ce5972f4e2658ea0f6e3686284/tee/lib/libutee/tee_api_objects.c#L283
- https://github.com/Samsung/mTower/issues/71