Vulnerabilities
Vulnerable Software

Vulnerability Details CVE-2022-25696

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
Exploit prediction scoring system (EPSS) score
EPSS Score 0.0
EPSS Ranking 14.3%
CVSS Severity
CVSS v3 Score 8.4
Products affected by CVE-2022-25696


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