Vulnerability Details CVE-2019-20607
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).
Exploit prediction scoring system (EPSS) score
EPSS Score 0.002
EPSS Ranking 45.9%
CVSS Severity
CVSS v3 Score 9.8
CVSS v2 Score 10.0
References
Products affected by CVE-2019-20607
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cpe:2.3:h:qualcomm:msm8996:-
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cpe:2.3:h:qualcomm:msm8998:-
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cpe:2.3:h:samsung:exynos_7420:-
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cpe:2.3:h:samsung:exynos_7870:-
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cpe:2.3:h:samsung:exynos_8890:-
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cpe:2.3:h:samsung:exynos_8895:-
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cpe:2.3:o:google:android:7.0
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cpe:2.3:o:google:android:7.1.0
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cpe:2.3:o:google:android:7.1.1
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cpe:2.3:o:google:android:7.1.2
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cpe:2.3:o:google:android:8.0
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cpe:2.3:o:google:android:8.1
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cpe:2.3:o:google:android:9.0