Vulnerability Details CVE-2018-11828
When FW tries to get random mac address generated from new SW RNG and ADC values read are constant then DUT get struck in loop while trying to get random ADC samples in Snapdragon Mobile in version SD 210/SD 212/SD 205, SD 425, SD 430, SD 450, SD 625, SD 650/52
Exploit prediction scoring system (EPSS) score
EPSS Score 0.002
EPSS Ranking 46.6%
CVSS Severity
CVSS v3 Score 7.5
CVSS v2 Score 7.8
References
Products affected by CVE-2018-11828
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cpe:2.3:h:qualcomm:sd_205:-
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cpe:2.3:h:qualcomm:sd_210:-
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cpe:2.3:h:qualcomm:sd_212:-
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cpe:2.3:h:qualcomm:sd_425:-
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cpe:2.3:h:qualcomm:sd_430:-
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cpe:2.3:h:qualcomm:sd_450:-
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cpe:2.3:h:qualcomm:sd_625:-
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cpe:2.3:h:qualcomm:sd_650:-
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cpe:2.3:h:qualcomm:sd_652:-
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cpe:2.3:o:qualcomm:sd_205_firmware:-
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cpe:2.3:o:qualcomm:sd_210_firmware:-
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cpe:2.3:o:qualcomm:sd_212_firmware:-
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cpe:2.3:o:qualcomm:sd_425_firmware:-
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cpe:2.3:o:qualcomm:sd_430_firmware:-
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cpe:2.3:o:qualcomm:sd_450_firmware:-
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cpe:2.3:o:qualcomm:sd_625_firmware:-
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cpe:2.3:o:qualcomm:sd_650_firmware:-
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cpe:2.3:o:qualcomm:sd_652_firmware:-