Vulnerability Details CVE-2017-14913
In Android before 2018-01-05 on Qualcomm Snapdragon IoT, Snapdragon Mobile MDM9206, SD 625, SD 650/52, SD 835, SD 845, DDR address input validation is being improperly truncated.
Exploit prediction scoring system (EPSS) score
EPSS Score 0.007
EPSS Ranking 72.1%
CVSS Severity
CVSS v3 Score 9.8
CVSS v2 Score 10.0
References
Products affected by CVE-2017-14913
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cpe:2.3:h:qualcomm:mdm9206:-
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cpe:2.3:h:qualcomm:sd_625:-
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cpe:2.3:h:qualcomm:sd_650:-
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cpe:2.3:h:qualcomm:sd_652:-
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cpe:2.3:h:qualcomm:sd_835:-
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cpe:2.3:h:qualcomm:sd_845:-
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cpe:2.3:o:qualcomm:mdm9206_firmware:-
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cpe:2.3:o:qualcomm:sd_625_firmware:-
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cpe:2.3:o:qualcomm:sd_650_firmware:-
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cpe:2.3:o:qualcomm:sd_652_firmware:-
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cpe:2.3:o:qualcomm:sd_835_firmware:-
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cpe:2.3:o:qualcomm:sd_845_firmware:-